We offer atom probe microscopy and advanced characterisation  services to both academia and industry. Although we have a geoscience focus, our team includes physicists and material scientists that have broad experience in a range of materials including metals, semiconductors and geopolymers.

If you are interested in finding out more about the analytical services we can offer then please contact us.

Atom Probe
​Microscopy

Atom probe microscopy provides nanoscale compositional information from tiny, needle-shaped, volumes of materials. The technique is capable of analysing the full periodic table from both conducting and non-conducting materials. 

Focussed Ion Beam Microscopy

The Tescan LYRA FIB-SEM can be used for high resolution imaging as well as for precision ion beam milling for etching, deposition, lithography and sample preparation/manipulation

Advanced Characterisation

The John de Laeter Centre offers a wide range of advanced characterisation techniques including SEM, EDS, EBSD, TKD, XRD, XRF, TOF-SIMS, SIMS, U-Th-He, Ar-Ar, Laser-ICPMS and much more
supported by the National Resource Sciences Precinct and the Science and Industry Endowment Fund